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Design and validation of a novel reconfigurable and defect tolerant JTAG scan chain

Yves Blaquiere, Yan Basile-Bellavance, Safa Berrima and Yvon Savaria

Paper (2014)

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Department: Department of Electrical Engineering
PolyPublie URL: https://publications.polymtl.ca/52359/
Conference Title: IEEE International Symposium on Circuits and Systems (ISCAS 2014)
Conference Location: Melbourne, VIC, Australia
Conference Date(s): 2014-06-01 - 2014-06-05
Publisher: IEEE
DOI: 10.1109/iscas.2014.6865695
Official URL: https://doi.org/10.1109/iscas.2014.6865695
Date Deposited: 18 Apr 2023 15:07
Last Modified: 05 Apr 2024 11:57
Cite in APA 7: Blaquiere, Y., Basile-Bellavance, Y., Berrima, S., & Savaria, Y. (2014, June). Design and validation of a novel reconfigurable and defect tolerant JTAG scan chain [Paper]. IEEE International Symposium on Circuits and Systems (ISCAS 2014), Melbourne, VIC, Australia (4 pages). https://doi.org/10.1109/iscas.2014.6865695

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