Yves Blaquière, Yan Basile-Bellavance, Safa Berrima and Yvon Savaria
Paper (2014)
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| Department: | Department of Electrical Engineering |
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| ISBN: | 9781479934324 |
| PolyPublie URL: | https://publications.polymtl.ca/52359/ |
| Conference Title: | IEEE International Symposium on Circuits and Systems (ISCAS 2014) |
| Conference Location: | Melbourne, VIC, Australia |
| Conference Date(s): | 2014-06-01 - 2014-06-05 |
| Publisher: | IEEE |
| DOI: | 10.1109/iscas.2014.6865695 |
| Official URL: | https://doi.org/10.1109/iscas.2014.6865695 |
| Date Deposited: | 18 Apr 2023 15:07 |
| Last Modified: | 08 Apr 2025 12:20 |
| Cite in APA 7: | Blaquière, Y., Basile-Bellavance, Y., Berrima, S., & Savaria, Y. (2014, June). Design and validation of a novel reconfigurable and defect tolerant JTAG scan chain [Paper]. IEEE International Symposium on Circuits and Systems (ISCAS 2014), Melbourne, VIC, Australia (4 pages). https://doi.org/10.1109/iscas.2014.6865695 |
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