Optimization of Small-Delay Defects Test Quality by Clock Speed Selection and Proper Masking Based on the Weighted Slack Percentage

Omar Al-Terkawi Hasib, Yvon Savaria and Claude Thibeault

Article (2020)

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Department:	Department of Electrical Engineering
Research Center:	GR2M - Microelectronics and Microsystems Research Group
PolyPublie URL:	https://publications.polymtl.ca/45098/
Journal Title:	IEEE Transactions on Very Large Scale Integration (VLSI) Systems (vol. 28, no. 3)
Publisher:	IEEE
DOI:	10.1109/tvlsi.2019.2949037
Official URL:	https://doi.org/10.1109/tvlsi.2019.2949037
Date Deposited:	18 Apr 2023 15:00
Last Modified:	08 Apr 2025 07:10

Cite in APA 7:	Hasib, O. A.-T., Savaria, Y., & Thibeault, C. (2020). Optimization of Small-Delay Defects Test Quality by Clock Speed Selection and Proper Masking Based on the Weighted Slack Percentage. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 28(3), 764-776. https://doi.org/10.1109/tvlsi.2019.2949037
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