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Hasib, O. A.-T., Savaria, Y., & Thibeault, C. (2020). Multi-PVT-Point Analysis and Comparison of Recent Small-Delay Defect Quality Metrics. Journal of Electronic Testing-Theory and Applications, 35(6), 823-838. Lien externe
Hasib, O. A.-T., Savaria, Y., & Thibeault, C. (2020). Optimization of Small-Delay Defects Test Quality by Clock Speed Selection and Proper Masking Based on the Weighted Slack Percentage. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 28(3), 764-776. Lien externe
Hasib, O. A.-T., Crepeau, D., Awad, T., Dulipovici, A., Savaria, Y., & Thibeault, C. (avril 2018). Exploiting built-in delay lines for applying launch-on-capture at-speed testing on self-timed circuits [Communication écrite]. 36th IEEE VLSI Test Symposium (VTS 2018), Los Alamitos, CA (6 pages). Lien externe
Hasib, O. A.-T., Savaria, Y., & Thibeault, C. (avril 2016). WeSPer: a flexible small delay defect quality metric [Communication écrite]. 34th IEEE VLSI Test Symposium (VTS 2016), Las Vegas, Nevada (6 pages). Lien externe
Hasib, O. A.-T., Sawan, M., & Savaria, Y. (mai 2010). Fully integrated ultra-low-power asynchronously driven step-down DC-DC converter [Communication écrite]. IEEE International Symposium on Circuits and Systems (ISCAS 2010), Paris, France. Lien externe