Omar Al-Terkawi Hasib, Yvon Savaria
and Claude Thibeault
Paper (2016)
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| Department: | Department of Electrical Engineering |
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| Research Center: | GR2M - Microelectronics and Microsystems Research Group |
| ISBN: | 9781467384544 |
| PolyPublie URL: | https://publications.polymtl.ca/35596/ |
| Conference Title: | 34th IEEE VLSI Test Symposium (VTS 2016) |
| Conference Location: | Las Vegas, Nevada |
| Conference Date(s): | 2016-04-25 - 2016-04-27 |
| Publisher: | IEEE |
| DOI: | 10.1109/vts.2016.7477266 |
| Official URL: | https://doi.org/10.1109/vts.2016.7477266 |
| Date Deposited: | 18 Apr 2023 15:05 |
| Last Modified: | 25 Sep 2024 16:19 |
| Cite in APA 7: | Hasib, O. A.-T., Savaria, Y., & Thibeault, C. (2016, April). WeSPer: a flexible small delay defect quality metric [Paper]. 34th IEEE VLSI Test Symposium (VTS 2016), Las Vegas, Nevada (6 pages). https://doi.org/10.1109/vts.2016.7477266 |
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