Nicolas Laflamme-Mayer, Gilbert Kowarzyk, Yves Blaquiere, Yvon Savaria
and Mohamad Sawan
Article (2018)
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| Department: | Department of Electrical Engineering |
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| Research Center: | GR2M - Microelectronics and Microsystems Research Group |
| PolyPublie URL: | https://publications.polymtl.ca/41897/ |
| Journal Title: | IEEE Transactions on Very Large Scale Integration (VLSI) Systems (vol. 27, no. 2) |
| Publisher: | IEEE |
| DOI: | 10.1109/tvlsi.2018.2876458 |
| Official URL: | https://doi.org/10.1109/tvlsi.2018.2876458 |
| Date Deposited: | 18 Apr 2023 15:03 |
| Last Modified: | 25 Sep 2024 16:28 |
| Cite in APA 7: | Laflamme-Mayer, N., Kowarzyk, G., Blaquiere, Y., Savaria, Y., & Sawan, M. (2018). A Defect-Tolerant Reusable Network of DACs for Wafer-Scale Integration. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 27(2), 304-315. https://doi.org/10.1109/tvlsi.2018.2876458 |
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