Diagnosis algorithms for a reconfigurable and defect tolerant JTAG scan chain in large area integrated circuits

Safa Berrima, Yves Blaquière and Yvon Savaria

Article (2018)

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Department:	Department of Electrical Engineering
Research Center:	GR2M - Microelectronics and Microsystems Research Group
PolyPublie URL:	https://publications.polymtl.ca/39574/
Journal Title:	Integration (vol. 62)
Publisher:	Elsevier
DOI:	10.1016/j.vlsi.2018.02.010
Official URL:	https://doi.org/10.1016/j.vlsi.2018.02.010
Date Deposited:	18 Apr 2023 15:02
Last Modified:	25 Sep 2024 16:24

Cite in APA 7:	Berrima, S., Blaquière, Y., & Savaria, Y. (2018). Diagnosis algorithms for a reconfigurable and defect tolerant JTAG scan chain in large area integrated circuits. Integration, 62, 159-169. https://doi.org/10.1016/j.vlsi.2018.02.010
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