<  Back to the Polytechnique Montréal portal

Diagnosis algorithms for a reconfigurable and defect tolerant JTAG scan chain in large area integrated circuits

Safa Berrima, Yves Blaquière and Yvon Savaria

Article (2018)

An external link is available for this item
Department: Department of Electrical Engineering
Research Center: GR2M - Microelectronics and Microsystems Research Group
PolyPublie URL: https://publications.polymtl.ca/39574/
Journal Title: Integration (vol. 62)
Publisher: Elsevier
DOI: 10.1016/j.vlsi.2018.02.010
Official URL: https://doi.org/10.1016/j.vlsi.2018.02.010
Date Deposited: 18 Apr 2023 15:02
Last Modified: 05 Apr 2024 11:35
Cite in APA 7: Berrima, S., Blaquière, Y., & Savaria, Y. (2018). Diagnosis algorithms for a reconfigurable and defect tolerant JTAG scan chain in large area integrated circuits. Integration, 62, 159-169. https://doi.org/10.1016/j.vlsi.2018.02.010

Statistics

Dimensions

Repository Staff Only

View Item View Item