A fast method to evaluate the optimum number of spares in defect-tolerant integrated-circuits

Claude Thibeault, Yvon Savaria, Jean-Louis Houle

Article (1994)

Access this document
External link
An external link is available for this item
View at the official publisher
Additional Information:
Nom historique du département: Département de génie électrique et de génie informatique
Department:
Department of Electrical Engineering
Department of Computer Engineering and Software Engineering
PolyPublie URL:
https://publications.polymtl.ca/32811/
Journal Title :
IEEE Transactions on Computers ( vol. 43 , no. 6 )
Publisher:
IEEE
DOI:
10.1109/12.286302
Official URL:
https://doi.org/10.1109/12.286302
OAI:
oai:publications.polymtl.ca:32811
ORCID
Date Deposited:
18 Apr 2023 15:25
Last Modified:
02 Oct 2026 22:59
Cite in APA 7:
Thibeault, C., Savaria, Y., & Houle, J.-L. (1994). A fast method to evaluate the optimum number of spares in defect-tolerant integrated-circuits. IEEE Transactions on Computers, 43(6), 687-697. https://doi.org/10.1109/12.286302

Statistics

Dimensions

Repository Staff Only

View Item
View Item