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A fast method to evaluate the optimum number of spares in defect-tolerant integrated-circuits

Claude Thibeault, Yvon Savaria and Jean-Louis Houle

Article (1994)

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Additional Information: Nom historique du département: Département de génie électrique et de génie informatique
Department: Department of Electrical Engineering
Department of Computer Engineering and Software Engineering
PolyPublie URL: https://publications.polymtl.ca/32811/
Journal Title: IEEE Transactions on Computers (vol. 43, no. 6)
Publisher: IEEE
DOI: 10.1109/12.286302
Official URL: https://doi.org/10.1109/12.286302
Date Deposited: 18 Apr 2023 15:25
Last Modified: 06 May 2024 16:21
Cite in APA 7: Thibeault, C., Savaria, Y., & Houle, J.-L. (1994). A fast method to evaluate the optimum number of spares in defect-tolerant integrated-circuits. IEEE Transactions on Computers, 43(6), 687-697. https://doi.org/10.1109/12.286302

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