C. Thibeault, Yvon Savaria
and Jean-Louis Houle
Article (1995)
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| Additional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
|---|---|
| Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
| PolyPublie URL: | https://publications.polymtl.ca/31691/ |
| Journal Title: | IEEE Transactions on Computers (vol. 44, no. 5) |
| Publisher: | IEEE |
| DOI: | 10.1109/12.381962 |
| Official URL: | https://doi.org/10.1109/12.381962 |
| Date Deposited: | 18 Apr 2023 15:25 |
| Last Modified: | 08 Apr 2025 06:52 |
| Cite in APA 7: | Thibeault, C., Savaria, Y., & Houle, J.-L. (1995). Equivalence proofs of some yield modeling methods for defect-tolerant integrated-circuits. IEEE Transactions on Computers, 44(5), 724-728. https://doi.org/10.1109/12.381962 |
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