Yves Gagnon, Yvon Savaria, Michel Meunier
and Claude Thibeault
Paper (1997)
An external link is available for this item| Additional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
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| Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering Department of Engineering Physics |
| PolyPublie URL: | https://publications.polymtl.ca/30459/ |
| Conference Title: | IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems (DFT 1997) |
| Conference Location: | Paris, Fr |
| Conference Date(s): | 1997-10-20 - 1997-10-22 |
| Publisher: | IEEE Comp Soc |
| DOI: | 10.1109/dftvs.1997.628321 |
| Official URL: | https://doi.org/10.1109/dftvs.1997.628321 |
| Date Deposited: | 18 Apr 2023 15:23 |
| Last Modified: | 08 Apr 2025 02:21 |
| Cite in APA 7: | Gagnon, Y., Savaria, Y., Meunier, M., & Thibeault, C. (1997, October). Are defect-tolerant circuits with redundancy really cost-effective? Complete and realistic cost model [Paper]. IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems (DFT 1997), Paris, Fr. https://doi.org/10.1109/dftvs.1997.628321 |
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