Mohamed Nekili, Yvon Savaria
and Guy Bois
Article (1999)
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| Additional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
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| Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
| PolyPublie URL: | https://publications.polymtl.ca/28726/ |
| Journal Title: | IEEE Journal of Solid-State Circuits (vol. 34, no. 1) |
| Publisher: | IEEE |
| DOI: | 10.1109/4.736658 |
| Official URL: | https://doi.org/10.1109/4.736658 |
| Date Deposited: | 18 Apr 2023 15:22 |
| Last Modified: | 25 Sep 2024 16:09 |
| Cite in APA 7: | Nekili, M., Savaria, Y., & Bois, G. (1999). Spatial Characterization of Process Variations Via Mos Transistor Time Constants in Vlsi and Wsi. IEEE Journal of Solid-State Circuits, 34(1), 80-84. https://doi.org/10.1109/4.736658 |
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