<  Back to the Polytechnique Montréal portal

SIED: software implemented error detection

B. Nicolescu, Yvon Savaria and R. Velazco

Paper (2003)

An external link is available for this item
Department: Department of Electrical Engineering
PolyPublie URL: https://publications.polymtl.ca/25615/
Conference Title: 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2003)
Conference Location: Boston, MA, United states
Conference Date(s): 2003-11-03 - 2003-11-05
Publisher: IEEE
DOI: 10.1109/dftvs.2003.1250159
Official URL: https://doi.org/10.1109/dftvs.2003.1250159
Date Deposited: 18 Apr 2023 15:20
Last Modified: 15 Apr 2024 16:57
Cite in APA 7: Nicolescu, B., Savaria, Y., & Velazco, R. (2003, November). SIED: software implemented error detection [Paper]. 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2003), Boston, MA, United states. https://doi.org/10.1109/dftvs.2003.1250159

Statistics

Dimensions

Repository Staff Only

View Item View Item