B. Nicolescu, Yvon Savaria
and R. Velazco
Paper (2003)
An external link is available for this item
| Department: | Department of Electrical Engineering |
|---|---|
| ISBN: | 0769520421 |
| PolyPublie URL: | https://publications.polymtl.ca/25615/ |
| Conference Title: | 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2003) |
| Conference Location: | Boston, MA, United states |
| Conference Date(s): | 2003-11-03 - 2003-11-05 |
| Publisher: | IEEE |
| DOI: | 10.1109/dftvs.2003.1250159 |
| Official URL: | https://doi.org/10.1109/dftvs.2003.1250159 |
| Date Deposited: | 18 Apr 2023 15:20 |
| Last Modified: | 08 Apr 2025 02:14 |
| Cite in APA 7: | Nicolescu, B., Savaria, Y., & Velazco, R. (2003, November). SIED: software implemented error detection [Paper]. 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2003), Boston, MA, United states. https://doi.org/10.1109/dftvs.2003.1250159 |
|---|---|
Statistics
Dimensions
Repository Staff Only
|
View Item |
