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Ignat, N., Nicolescu, B., Savaria, Y., & Nicolescu, G. Soft-Error Classification and Impact Analysis on Real-Time Operating Systems [Communication écrite]. Design, Automation and Test in Europe Conference and Exhibition (DATE 2006). Lien externe
Nicolescu, B., Ignat, N., Savaria, Y., & Nicolescu, G. (2006). Analysis of real-time systems sensitivity to transient faults using MicroC kernel. IEEE Transactions on Nuclear Science, 53(4), 1902-1909. Lien externe
Nicolescu, B., Ignat, N., Savaria, Y., & Nicolescu, G. (septembre 2005). Sensitivity of real-time operating systems to transient faults : A cause study for microC kernel [Communication écrite]. 8th European Conference on Radiation and its Effects on Components and Systems (RADECS 2005). Lien externe
Nicolescu, B., Savaria, Y., & Velazco, R. (2004). Software detection mechanisms providing full coverage against single bit-flip faults. IEEE Transactions on Nuclear Science, 51(6), 3510-3518. Lien externe
Nicolescu, B., Gorse, N., Savaria, Y., Aboulhamid, E. M., & Velazco, R. (septembre 2004). Validating a dynamic signature monitoring approach using the LTL model checking technique [Communication écrite]. Workshop on Radiation Effects on Components and Systems (RADECS 2004), Madrid, Espagne. Non disponible
Nicolescu, B., Perronnard, P., Velazco, R., & Savaria, Y. (novembre 2003). Efficiency of transient bit-flips detection by software means a complete study [Communication écrite]. 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2003), Cambridge, MA, USA. Lien externe
Nicolescu, B., Savaria, Y., & Velazco, R. (novembre 2003). SIED: software implemented error detection [Communication écrite]. 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2003), Boston, MA, United states. Lien externe
