K. A. Bratland, T. Spila, D. G. Cahill, J. E. Greene and Patrick Desjardins
Article (2011)
An external link is available for this item| Department: | Department of Engineering Physics |
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| Research Center: | RQMP - Regroupement québécois sur les matériaux de pointe |
| Funders: | U.S. Department of Energy (DOE) |
| Grant number: | DEFG02-07ER46453, DEFG02-07ER46471 |
| PolyPublie URL: | https://publications.polymtl.ca/17153/ |
| Journal Title: | Journal of Applied Physics (vol. 109, no. 6) |
| Publisher: | American Institute of Physics |
| DOI: | 10.1063/1.3556745 |
| Official URL: | https://doi.org/10.1063/1.3556745 |
| Date Deposited: | 18 Apr 2023 15:11 |
| Last Modified: | 25 Apr 2025 16:47 |
| Cite in APA 7: | Bratland, K. A., Spila, T., Cahill, D. G., Greene, J. E., & Desjardins, P. (2011). Continuum model of surface roughening and epitaxial breakdown during low-temperature Ge(001) molecular beam epitaxy. Journal of Applied Physics, 109(6), 5 pages. https://doi.org/10.1063/1.3556745 |
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