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Ammar, M., Hamad, G. B., Mohamed, O. A., & Savaria, Y. (2017). System-Level Analysis of the Vulnerability of Processors Exposed to Single Event Upsets via Probabilistic Model Checking. IEEE Transactions on Nuclear Science, 64(9), 2523-2530. Lien externe
Ammar, M., Hamad, G. B., Mohamed, O. A., Savaria, Y., & Velazco, R. (septembre 2016). Comprehensive vulnerability analysis of systems exposed to SEUs via probabilistic model checking [Communication écrite]. 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2016), Bremen, Germany (4 pages). Lien externe
Hamad, G. B., Ait Mohamed, O., & Savaria, Y. (2017). Formal Methods Based Synthesis of Single Event Transient Tolerant Combinational Circuits. Journal of Electronic Testing: Theory and Applications, 33(5), 607-620. Lien externe
Hamad, G. B., Mohamed, O. A., & Savaria, Y. (septembre 2016). Investigating the efficiency of cell level hardening techniques of single event transients via SMT [Communication écrite]. 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2016), Bremen, Germany (4 pages). Lien externe
Kazma, G., Hamad, G. B., Mohamed, O. A., & Savaria, Y. (mai 2017). Analysis of SEU Propagation in Combinational Circuits at RTL Based on Satisfiability Modulo Theories [Communication écrite]. Great Lakes Symposium on VLSI (GLSVLSI 2017), Banff, Alberta. Lien externe
