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Arabi, K., & Kaminska, B. (1998). Design for Testability of Embedded Integrated Operational Amplifiers. IEEE Journal of Solid-State Circuits, 33(4), 573-581. Lien externe
Arabi, K., Kaminska, B., & Sawan, M. (1998). On Chip Testing Data Converters Using Static Parameters. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 6(3), 409-419. Lien externe
Boyogueno Bendé, A., & Kaminska, B. (septembre 1998). Broad-band low-noise preamplifier design with GaAs MESFETs for optical communication systems [Communication écrite]. URSI International Symposium on Signal, Systems, and Electronics, Pisa, Italy. Lien externe
Ehsanian, M., Kaminska, B., & Arabi, K. (1998). New on-Chip Digital Bist for Analog-to-Digital Converters. Microelectronics and reliability, 38(3), 409-420. Lien externe
Jamoussi, M., Amellal, S., & Kaminska, B. (décembre 1998). High-level testability evaluation of TASS synthesized systems [Communication écrite]. 10th International Conference on Microelectronics (ICM 1998), Monastir, Tunisia. Lien externe
Sokolowska, E., Fortin, G., Belabbes, N., Gagnon, M., & Kaminska, B. (septembre 1998). Scalable pseudo-optical switching system for multi-protocol environment [Communication écrite]. IEEE International Conference on Electronics, Circuits, and Systems, Lisboa, Portugal. Lien externe
Sylla, I. T., Slamani, M., Kaminska, B., Hossein, F. M., & Vincent, P. (avril 1998). Impedance mismatch and lumped capacitance effects in high frequency testing [Communication écrite]. 16th IEEE VLSI Test Symposium, Monterey, CA, USA. Lien externe
