K. Arabi, Bozena Kaminska and Mohamad Sawan
Article (1998)
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| Additional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
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| Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
| PolyPublie URL: | https://publications.polymtl.ca/29901/ |
| Journal Title: | IEEE Transactions on Very Large Scale Integration (VLSI) Systems (vol. 6, no. 3) |
| Publisher: | IEEE |
| DOI: | 10.1109/92.711312 |
| Official URL: | https://doi.org/10.1109/92.711312 |
| Date Deposited: | 18 Apr 2023 15:22 |
| Last Modified: | 25 Sep 2024 16:11 |
| Cite in APA 7: | Arabi, K., Kaminska, B., & Sawan, M. (1998). On Chip Testing Data Converters Using Static Parameters. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 6(3), 409-419. https://doi.org/10.1109/92.711312 |
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