M. Jamoussi, S. Amellal and Bozena Kaminska
Paper (1998)
An external link is available for this itemAdditional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
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Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
PolyPublie URL: | https://publications.polymtl.ca/40410/ |
Conference Title: | 10th International Conference on Microelectronics (ICM 1998) |
Conference Location: | Monastir, Tunisia |
Conference Date(s): | 1998-12-14 - 1998-12-16 |
Publisher: | IEEE |
DOI: | 10.1109/icm.1998.825572 |
Official URL: | https://doi.org/10.1109/icm.1998.825572 |
Date Deposited: | 18 Apr 2023 15:23 |
Last Modified: | 25 Sep 2024 16:25 |
Cite in APA 7: | Jamoussi, M., Amellal, S., & Kaminska, B. (1998, December). High-level testability evaluation of TASS synthesized systems [Paper]. 10th International Conference on Microelectronics (ICM 1998), Monastir, Tunisia. https://doi.org/10.1109/icm.1998.825572 |
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