Mohamed Jamoussi, Said Amellal and Bożena Kamińska
Paper (1998)
An external link is available for this item| Additional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
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| Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
| ISBN: | 0780349695 |
| PolyPublie URL: | https://publications.polymtl.ca/40410/ |
| Conference Title: | 10th International Conference on Microelectronics (ICM 1998) |
| Conference Location: | Monastir, Tunisia |
| Conference Date(s): | 1998-12-14 - 1998-12-16 |
| Publisher: | Institute of Electrical and Electronics Engineers |
| DOI: | 10.1109/icm.1998.825572 |
| Official URL: | https://doi.org/10.1109/icm.1998.825572 |
| Date Deposited: | 18 Apr 2023 15:23 |
| Last Modified: | 14 Apr 2026 10:28 |
| Cite in APA 7: | Jamoussi, M., Amellal, S., & Kamińska, B. (1998, December). High-level testability evaluation of TASS synthesized systems [Paper]. 10th International Conference on Microelectronics (ICM 1998), Monastir, Tunisia. https://doi.org/10.1109/icm.1998.825572 |
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