I. T. Sylla, M. Slamani, Bozena Kaminska, F. M. Hossein and P. Vincent
Paper (1998)
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| Additional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
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| Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
| PolyPublie URL: | https://publications.polymtl.ca/29299/ |
| Conference Title: | 16th IEEE VLSI Test Symposium |
| Conference Location: | Monterey, CA, USA |
| Conference Date(s): | 1998-04-26 - 1998-04-30 |
| Publisher: | IEEE Comput. Soc |
| DOI: | 10.1109/vtest.1998.670875 |
| Official URL: | https://doi.org/10.1109/vtest.1998.670875 |
| Date Deposited: | 18 Apr 2023 15:23 |
| Last Modified: | 25 Sep 2024 16:10 |
| Cite in APA 7: | Sylla, I. T., Slamani, M., Kaminska, B., Hossein, F. M., & Vincent, P. (1998, April). Impedance mismatch and lumped capacitance effects in high frequency testing [Paper]. 16th IEEE VLSI Test Symposium, Monterey, CA, USA. https://doi.org/10.1109/vtest.1998.670875 |
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