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Impedance mismatch and lumped capacitance effects in high frequency testing

I. T. Sylla, M. Slamani, Bozena Kaminska, F. M. Hossein and P. Vincent

Paper (1998)

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Additional Information: Nom historique du département: Département de génie électrique et de génie informatique
Department: Department of Electrical Engineering
Department of Computer Engineering and Software Engineering
PolyPublie URL: https://publications.polymtl.ca/29299/
Conference Title: 16th IEEE VLSI Test Symposium
Conference Location: Monterey, CA, USA
Conference Date(s): 1998-04-26 - 1998-04-30
Publisher: IEEE Comput. Soc
DOI: 10.1109/vtest.1998.670875
Official URL: https://doi.org/10.1109/vtest.1998.670875
Date Deposited: 18 Apr 2023 15:23
Last Modified: 05 Apr 2024 11:18
Cite in APA 7: Sylla, I. T., Slamani, M., Kaminska, B., Hossein, F. M., & Vincent, P. (1998, April). Impedance mismatch and lumped capacitance effects in high frequency testing [Paper]. 16th IEEE VLSI Test Symposium, Monterey, CA, USA. https://doi.org/10.1109/vtest.1998.670875

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