Article (1998)
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| Additional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
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| Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
| PolyPublie URL: | https://publications.polymtl.ca/29902/ |
| Journal Title: | IEEE Journal of Solid-State Circuits (vol. 33, no. 4) |
| Publisher: | IEEE |
| DOI: | 10.1109/4.663562 |
| Official URL: | https://doi.org/10.1109/4.663562 |
| Date Deposited: | 18 Apr 2023 15:22 |
| Last Modified: | 08 Apr 2025 02:20 |
| Cite in APA 7: | Arabi, K., & Kaminska, B. (1998). Design for Testability of Embedded Integrated Operational Amplifiers. IEEE Journal of Solid-State Circuits, 33(4), 573-581. https://doi.org/10.1109/4.663562 |
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