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Design for Testability of Embedded Integrated Operational Amplifiers

K. Arabi and Bozena Kaminska

Article (1998)

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Additional Information: Nom historique du département: Département de génie électrique et de génie informatique
Department: Department of Electrical Engineering
Department of Computer Engineering and Software Engineering
PolyPublie URL: https://publications.polymtl.ca/29902/
Journal Title: IEEE Journal of Solid-State Circuits (vol. 33, no. 4)
Publisher: IEEE
DOI: 10.1109/4.663562
Official URL: https://doi.org/10.1109/4.663562
Date Deposited: 18 Apr 2023 15:22
Last Modified: 05 Apr 2024 11:18
Cite in APA 7: Arabi, K., & Kaminska, B. (1998). Design for Testability of Embedded Integrated Operational Amplifiers. IEEE Journal of Solid-State Circuits, 33(4), 573-581. https://doi.org/10.1109/4.663562

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