Design for Testability of Embedded Integrated Operational Amplifiers

K. Arabi and Bozena Kaminska

Article (1998)

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Additional Information:	Nom historique du département: Département de génie électrique et de génie informatique
Department:	Department of Electrical Engineering Department of Computer Engineering and Software Engineering
PolyPublie URL:	https://publications.polymtl.ca/29902/
Journal Title:	IEEE Journal of Solid-State Circuits (vol. 33, no. 4)
Publisher:	IEEE
DOI:	10.1109/4.663562
Official URL:	https://doi.org/10.1109/4.663562
Date Deposited:	18 Apr 2023 15:22
Last Modified:	25 Sep 2024 16:11

Cite in APA 7:	Arabi, K., & Kaminska, B. (1998). Design for Testability of Embedded Integrated Operational Amplifiers. IEEE Journal of Solid-State Circuits, 33(4), 573-581. https://doi.org/10.1109/4.663562
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