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Ammar, M., Bany Hamad, G., Mohamed, O. A., Savaria, Y., & Velazco, R. (2016, September). Comprehensive vulnerability analysis of systems exposed to SEUs via probabilistic model checking [Paper]. 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2016), Bremen, Germany (4 pages). External link
Nicolescu, B., Gorse, N., Savaria, Y., Aboulhamid, E. M., & Velazco, R. (2005). On the Use of Model Checking for the Verification of a Dynamic Signature Monitoring Approach. IEEE Transactions on Nuclear Science, 52(5), 1555-1561. External link
Nicolescu, B., Perronnard, P., Velazco, R., & Savaria, Y. (2003, November). Efficiency of transient bit-flips detection by software means a complete study [Paper]. 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2003), Cambridge, MA, USA. External link
