Basarab Nicolescu, Paul Perronnard, Raoul Velazco and Yvon Savaria
Paper (2003)
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| Department: | Department of Electrical Engineering |
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| ISBN: | 0769520421 |
| PolyPublie URL: | https://publications.polymtl.ca/25616/ |
| Conference Title: | 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2003) |
| Conference Location: | Cambridge, MA, USA |
| Conference Date(s): | 2003-11-05 |
| Publisher: | IEEE |
| DOI: | 10.1109/dftvs.2003.1250134 |
| Official URL: | https://doi.org/10.1109/dftvs.2003.1250134 |
| Date Deposited: | 18 Apr 2023 15:20 |
| Last Modified: | 08 Apr 2025 02:14 |
| Cite in APA 7: | Nicolescu, B., Perronnard, P., Velazco, R., & Savaria, Y. (2003, November). Efficiency of transient bit-flips detection by software means a complete study [Paper]. 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2003), Cambridge, MA, USA. https://doi.org/10.1109/dftvs.2003.1250134 |
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