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Efficiency of transient bit-flips detection by software means a complete study

B. Nicolescu, Paul Perronnard, Raoul Velazco and Yvon Savaria

Paper (2003)

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Department: Department of Electrical Engineering
PolyPublie URL: https://publications.polymtl.ca/25616/
Conference Title: 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2003)
Conference Location: Cambridge, MA, USA
Conference Date(s): 2003-11-05
Publisher: IEEE
DOI: 10.1109/dftvs.2003.1250134
Official URL: https://doi.org/10.1109/dftvs.2003.1250134
Date Deposited: 18 Apr 2023 15:20
Last Modified: 01 Nov 2023 16:21
Cite in APA 7: Nicolescu, B., Perronnard, P., Velazco, R., & Savaria, Y. (2003, November). Efficiency of transient bit-flips detection by software means a complete study [Paper]. 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2003), Cambridge, MA, USA. https://doi.org/10.1109/dftvs.2003.1250134

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