Documents dont l'auteur est "Schiettekatte, François"

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Béland, L. K., Anahory, Y., Smeets, D., Guihard, M., Brommer, P., Joly, J.-F., Pothier, J.-C., Lewis, L. J., Mousseau, N., & Schiettekatte, F. (2013). Replenish and Relax: Explaining Logarithmic Annealing in Ion-Implanted c-Si. Physical Review Letters, 111(10), 105502 (5 pages). Lien externe

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Dion, C., Desjardins, P., Schiettekatte, F., Chicoine, M., Poole, P. J., & Raymond, S. (2006). Tuning the Electronic Properties of Self-Assembled InAs/InP(001) Quantum Dots. ECS Meeting Abstracts, MA2006-02(26), 1269-1269. Lien externe

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Kallel, H., Mousseau, N., & Schiettekatte, F. (2010). Evolution of the Potential-Energy Surface of Amorphous Silicon. Physical Review Letters, 105(4), 045503 (4 pages). Lien externe

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Lussier, A. W., Bourbonnais-Sureault, D., Chicoine, M., Martel, R., Martinu, L., Roorda, S., & Schiettekatte, F. (2024). Raman-based mapping and depth-profiling of the relaxation state in amorphous silicon. Journal of Applied Physics, 135(6), 065301 (12 pages). Lien externe

Lussier, A. W., Lalande, É., Chicoine, M., Lévesque, C., Roorda, S., Baloukas, B., Martinu, L., Vajente, G., Ananyeva, A., & Schiettekatte, F. (octobre 2021). Hydrogen concentration and mechanical dissipation upon annealing in zirconia-doped tantala thin films for gravitational wave observatory mirrors [Communication écrite]. 25th International Conference on Ion Beam Analysis and 17th International Conference on Particle Induce X-Ray Emission (IBA-PIXE 2021) and 23rd International Conference on Secondary Ion Mass Spectrometry (SIMS 2021) (7 pages). Publié dans Journal of Physics, 2326. Disponible

Lalande, É., Lussier, A. W., Lévesque, C., Ward, M., Baloukas, B., Martinu, L., Vajente, G., Billingsley, G., Ananyeva, A., Bassiri, R., Fejer, M. M., & Schiettekatte, F. (2021). Zirconia-titania-doped tantala optical coatings for low mechanical loss Bragg mirrors. Journal of Vacuum Science & Technology A, 39(4), 8 pages. Lien externe

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Turcotte-Tremblay, P., Guihard, M., Gaudet, S., Chicoine, M., Lavoie, C., Desjardins, P., & Schiettekatte, F. (2013). Thin film Ni-Si solid-state reactions: Phase formation sequence on amorphized Si. Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena, 31(5). Lien externe