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Jay, A., Hémeryck, A., Richard, N., Martin-Samos, L., Raine, M., Roch, A. L., Mousseau, N., Goiffon, V., Paillet, P., Gaillardin, M., & Magnan, P. (2018). Simulation of Single-Particle Displacement Damage in Silicon. Part III: First Principle Characterization of Defect Properties. IEEE Transactions on Nuclear Science, 65(2), 724-731. External link
Jay, A., Raine, M., Richard, N., Mousseau, N., Goiffon, V. I., Hémeryck, A., & Magna, P. (2017). Simulation of Single Particle Displacement Damage in Silicon-Part II: Generation and Long-Time Relaxation of Damage Structure. IEEE Transactions on Nuclear Science, 64(1), 141-148. External link
