Simulation of Single Particle Displacement Damage in Silicon-Part II: Generation and Long-Time Relaxation of Damage Structure

Antoine Jay, Mélanie Raine, Nicolas Richard, Normand Mousseau, Vincent Goiffon, Anne Hémeryck and Pierre Magna

Article (2017)

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Department:	Department of Mathematics and Industrial Engineering
PolyPublie URL:	https://publications.polymtl.ca/41467/
Journal Title:	IEEE Transactions on Nuclear Science (vol. 64, no. 1)
Publisher:	IEEE
DOI:	10.1109/tns.2016.2628089
Official URL:	https://doi.org/10.1109/tns.2016.2628089
Date Deposited:	18 Apr 2023 15:04
Last Modified:	08 Apr 2025 07:05

Cite in APA 7:	Jay, A., Raine, M., Richard, N., Mousseau, N., Goiffon, V., Hémeryck, A., & Magna, P. (2017). Simulation of Single Particle Displacement Damage in Silicon-Part II: Generation and Long-Time Relaxation of Damage Structure. IEEE Transactions on Nuclear Science, 64(1), 141-148. https://doi.org/10.1109/tns.2016.2628089
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