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Items where Author is "Hamel, Louis-André"

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Number of items: 4.

Maassen, J., Yelon, A., Hamel, L.-A., & Chao Chen, W. (2005). Multiple-Trapping Model with Meyer-Neldel Effect and Field-Dependent Effects: Time-Of-Flight Simulations for a-Si:H. MRS Proceedings, 862. External link

Chen, W. C., Kemp, M., Hamel, L.-A., & Yelon, A. (2000). Rapid Relaxation and Electronic Properties of a-Si : H. Journal of Non-Crystalline Solids, 277(2-3), 219-224. External link

Chen, W. C., Hamel, L.-A., Kemp, M., & Yelon, A. (1999). Modelling of Drift Mobility Experiments on a-Si:H. MRS Proceedings, 557, 433-438. External link

Chen, W. C., Hamel, L.-A., & Yelon, A. (1997). Monte Carlo simulations of Meyer-Neldel effect on carrier time-of-flight in a-Si:H. Journal of Non-Crystalline Solids, 220(2-3), 254-260. External link

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