Wen Chao Chen, Louis-André Hamel and Arthur Yelon
Article (1997)
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| Department: | Department of Engineering Physics |
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| Research Center: | GCM - Thin Film Physics and Technology Research Group |
| PolyPublie URL: | https://publications.polymtl.ca/30597/ |
| Journal Title: | Journal of Non-Crystalline Solids (vol. 220, no. 2-3) |
| Publisher: | Elsevier |
| DOI: | 10.1016/s0022-3093(97)00260-3 |
| Official URL: | https://doi.org/10.1016/s0022-3093%2897%2900260-3 |
| Date Deposited: | 18 Apr 2023 15:23 |
| Last Modified: | 25 Sep 2024 16:12 |
| Cite in APA 7: | Chen, W. C., Hamel, L.-A., & Yelon, A. (1997). Monte Carlo simulations of Meyer-Neldel effect on carrier time-of-flight in a-Si:H. Journal of Non-Crystalline Solids, 220(2-3), 254-260. https://doi.org/10.1016/s0022-3093%2897%2900260-3 |
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