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Multiple-Trapping Model with Meyer-Neldel Effect and Field-Dependent Effects: Time-Of-Flight Simulations for a-Si:H

Jesse Maassen, Arthur Yelon, Louis-André Hamel and Wen Chao Chen

Article (2005)

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Department: Department of Engineering Physics
PolyPublie URL: https://publications.polymtl.ca/55618/
Journal Title: MRS Proceedings (vol. 862)
Publisher: Cambridge University Press
DOI: 10.1557/proc-862-a15.2
Official URL: https://doi.org/10.1557/proc-862-a15.2
Date Deposited: 19 Sep 2023 14:10
Last Modified: 05 Apr 2024 12:02
Cite in APA 7: Maassen, J., Yelon, A., Hamel, L.-A., & Chao Chen, W. (2005). Multiple-Trapping Model with Meyer-Neldel Effect and Field-Dependent Effects: Time-Of-Flight Simulations for a-Si:H. MRS Proceedings, 862. https://doi.org/10.1557/proc-862-a15.2

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