Multiple-Trapping Model with Meyer-Neldel Effect and Field-Dependent Effects: Time-Of-Flight Simulations for a-Si:H

Jesse Maassen, Arthur Yelon, Louis-André Hamel and Wen Chao Chen

Article (2005)

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Department:	Department of Engineering Physics
PolyPublie URL:	https://publications.polymtl.ca/55618/
Journal Title:	MRS Proceedings (vol. 862)
Publisher:	Cambridge University Press
DOI:	10.1557/proc-862-a15.2
Official URL:	https://doi.org/10.1557/proc-862-a15.2
Date Deposited:	19 Sep 2023 14:10
Last Modified:	25 Sep 2024 16:47

Cite in APA 7:	Maassen, J., Yelon, A., Hamel, L.-A., & Chao Chen, W. (2005). Multiple-Trapping Model with Meyer-Neldel Effect and Field-Dependent Effects: Time-Of-Flight Simulations for a-Si:H. MRS Proceedings, 862. https://doi.org/10.1557/proc-862-a15.2
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