Documents dont l'auteur est "Gauthier, Jules"

Article de revue

Zhu, H., Gauthier, J., & Wu, K. (2020). Silicon Probe Measurement and Characterization in Sub-THz Range. IEEE Transactions on Terahertz Science and Technology, 10(6), 606-616. Lien externe

Jacques, M., Bouvier, S., Denis, D., Patel, D., Samani, A., Saber, M. G., Mounaïm, F., Gauthier, J., & Plant, D. V. (2018). Analysis, modeling, and mitigation of parasitic resonances in integrated metallic seal rings. IEEE Transactions on Components, Packaging and Manufacturing Technology, 8(6), 1082-1091. Lien externe

Nerguizian, V., Alazzam, A., Gauthier, J., Roman, D., Stiharu, I., & Burnier, M. (2016). Microfluidic device fabrication with serigraphy technique. Proceedings of the Institution of Mechanical Engineers, Part B: Journal of Engineering Manufacture, 230(7), 1309-1316. Lien externe

Lorenz, C. H. P., Hemour, S., Li, W., Xie, Y., Gauthier, J., Fay, P., & Wu, K. (2015). Breaking the Efficiency Barrier for Ambient Microwave Power Harvesting With Heterojunction Backward Tunnel Diodes. IEEE Transactions on Microwave Theory and Techniques, 63(12), 4544-4555. Lien externe

Xu, Y., Gauthier, J., & Bosisio, R. (2000). Six-Port Digital Receivers (Spdrs): a New Design Approach. Microwave and Optical Technology Letters, 25(5), 356-360. Lien externe

Communication écrite

Djerafi, T., Gauthier, J., & Wu, K. (mai 2010). Quasi-optical cruciform substrate integrated waveguide (SIW) coupler for millimeter-wave systems [Communication écrite]. IEEE MTT-S International Microwave Symposium (IMS 2010), Anaheim, California. Lien externe

Marsan, E., Gauthier, J., Chaker, M., & Wu, K. (juin 2005). Tunable microwave device: status and perspective [Communication écrite]. 3rd IEEE International Northeast Workshop on Circuits and Systems (NEWCAS 2005). Lien externe

Demande de brevet

Gauthier, J., Ghiotto, A., & Wu, K. (2013). Bi-directional and multi-frequency RF signaling system. (Demande de brevet no US20130119135). Lien externe

Gauthier, J., Djerafi, T., Wu, K., & Patrovsky, A. (2013). Planar circuit test fixture. (Demande de brevet no US20130335110). Lien externe