M. Jacques, S. Bouvier, D. Denis, D. Patel, A. Samani, M. G. Saber, Fayçal Mounaïm, Jules Gauthier and D. V. Plant
Article (2018)
An external link is available for this item
| Department: | Department of Electrical Engineering |
|---|---|
| PolyPublie URL: | https://publications.polymtl.ca/39184/ |
| Journal Title: | IEEE Transactions on Components, Packaging and Manufacturing Technology (vol. 8, no. 6) |
| Publisher: | IEEE |
| DOI: | 10.1109/tcpmt.2017.2774188 |
| Official URL: | https://doi.org/10.1109/tcpmt.2017.2774188 |
| Date Deposited: | 18 Apr 2023 15:03 |
| Last Modified: | 25 Sep 2024 16:24 |
| Cite in APA 7: | Jacques, M., Bouvier, S., Denis, D., Patel, D., Samani, A., Saber, M. G., Mounaïm, F., Gauthier, J., & Plant, D. V. (2018). Analysis, modeling, and mitigation of parasitic resonances in integrated metallic seal rings. IEEE Transactions on Components, Packaging and Manufacturing Technology, 8(6), 1082-1091. https://doi.org/10.1109/tcpmt.2017.2774188 |
|---|---|
Statistics
Dimensions
Repository Staff Only
|
View Item |
