Haotian Zhu, Jules Gauthier and Ke Wu
Article (2020)
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| Department: | Department of Electrical Engineering |
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| Research Center: | POLY-GRAMES - Advanced Research Centre in Microwaves and Space Electronics |
| PolyPublie URL: | https://publications.polymtl.ca/45810/ |
| Journal Title: | IEEE Transactions on Terahertz Science and Technology (vol. 10, no. 6) |
| Publisher: | IEEE Microwave Theory and Techniques Society |
| DOI: | 10.1109/tthz.2020.3013802 |
| Official URL: | https://doi.org/10.1109/tthz.2020.3013802 |
| Date Deposited: | 18 Apr 2023 15:01 |
| Last Modified: | 08 Apr 2025 07:11 |
| Cite in APA 7: | Zhu, H., Gauthier, J., & Wu, K. (2020). Silicon Probe Measurement and Characterization in Sub-THz Range. IEEE Transactions on Terahertz Science and Technology, 10(6), 606-616. https://doi.org/10.1109/tthz.2020.3013802 |
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