Built-in self-test of a CMOS ALU

Eduard Cerny, El Mostapha Aboulhamid, Guy Bois and Jocelyn Cloutier

Article (1988)

Document published while its authors were not affiliated with Polytechnique Montréal

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Department:	Department of Computer Engineering and Software Engineering
Funders:	Natural Sciences and Engineering Research Council of Canada (NSERC)
PolyPublie URL:	https://publications.polymtl.ca/74120/
Journal Title:	IEEE Design & Test of Computers (vol. 5, no. 4)
Publisher:	Institute of Electrical and Electronics Engineers
DOI:	10.1109/54.7968
Official URL:	https://doi.org/10.1109/54.7968
Date Deposited:	13 Apr 2026 10:37
Last Modified:	13 Apr 2026 10:37

Cite in APA 7:	Cerny, E., Aboulhamid, E. M., Bois, G., & Cloutier, J. (1988). Built-in self-test of a CMOS ALU. IEEE Design & Test of Computers, 5(4), 38-48. https://doi.org/10.1109/54.7968
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