Master's thesis (2004)
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Open Access to the full text of this document Published Version Terms of Use: All rights reserved Download (8MB) |
| Additional Information: | Le fichier PDF de ce document a été produit par Bibliothèque et Archives Canada selon les termes du programme Thèses Canada https://canada.on.worldcat.org/oclc/63705050 |
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| Department: | Department of Electrical Engineering |
| Academic/Research Directors: |
Yvon Savaria
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| ISBN: | 0494013311; 9780494013311 |
| PolyPublie URL: | https://publications.polymtl.ca/7386/ |
| Institution: | École Polytechnique de Montréal |
| Date Deposited: | 04 Aug 2021 11:05 |
| Last Modified: | 28 Sep 2024 09:51 |
| Cite in APA 7: | Ghattas, N. (2004). Built-in self-test and self-repair architecture for defect-tolerant word-oriented large capacity memories [Master's thesis, École Polytechnique de Montréal]. PolyPublie. https://publications.polymtl.ca/7386/ |
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