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Characterization of integrated MOS circuits under voltage stress and application to power conversion chains of electronic implants

Seyed Saeid Hashemi Aghcheh Body

Master's thesis (2004)

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Uncontrolled Keywords

MOS (Électronique); Circuits intégrés

Additional Information: Le fichier PDF de ce document a été produit par Bibliothèque et Archives Canada selon les termes du programme Thèses Canada https://canada.on.worldcat.org/oclc/58053253
Department: Department of Electrical Engineering
Academic/Research Directors: Mohamad Sawan and Yvon Savaria
PolyPublie URL: https://publications.polymtl.ca/7315/
Institution: École Polytechnique de Montréal
Date Deposited: 04 Aug 2021 11:05
Last Modified: 06 Apr 2024 22:56
Cite in APA 7: Hashemi Aghcheh Body, S. S. (2004). Characterization of integrated MOS circuits under voltage stress and application to power conversion chains of electronic implants [Master's thesis, École Polytechnique de Montréal]. PolyPublie. https://publications.polymtl.ca/7315/

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