Characterization of integrated MOS circuits under voltage stress and application to power conversion chains of electronic implants

Seyed Saeid Hashemi Aghcheh Body

Master's thesis (2004)

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Uncontrolled Keywords

MOS (Électronique); Circuits intégrés

Additional Information:	Le fichier PDF de ce document a été produit par Bibliothèque et Archives Canada selon les termes du programme Thèses Canada https://canada.on.worldcat.org/oclc/58053253
Department:	Department of Electrical Engineering
Academic/Research Directors:	Mohamad Sawan and Yvon Savaria
PolyPublie URL:	https://publications.polymtl.ca/7315/
Institution:	École Polytechnique de Montréal
Date Deposited:	04 Aug 2021 11:05
Last Modified:	27 Sep 2024 21:09

Cite in APA 7:	Hashemi Aghcheh Body, S. S. (2004). Characterization of integrated MOS circuits under voltage stress and application to power conversion chains of electronic implants [Master's thesis, École Polytechnique de Montréal]. PolyPublie. https://publications.polymtl.ca/7315/
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