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A method based on complementary transmission and reflection measurements for extracting the optical properties of a thin film

Brett N. Carnio, Anis Attiaoui, Simone Assali, Oussama Moutanabbir, Abdulhakem Y. Elezzabi, Laurence P. Sadwick and Tianxin Yang

Paper (2022)

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Department: Department of Engineering Physics
PolyPublie URL: https://publications.polymtl.ca/52444/
Conference Title: Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XV
Conference Location: San Francisco, California, United States
Conference Date(s): 2022-01-22 - 2022-02-28
Publisher: SPIE
DOI: 10.1117/12.2607676
Official URL: https://doi.org/10.1117/12.2607676
Date Deposited: 18 Apr 2023 14:58
Last Modified: 05 Apr 2024 11:57
Cite in APA 7: Carnio, B. N., Attiaoui, A., Assali, S., Moutanabbir, O., Elezzabi, A. Y., Sadwick, L. P., & Yang, T. (2022, January). A method based on complementary transmission and reflection measurements for extracting the optical properties of a thin film [Paper]. Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XV, San Francisco, California, United States. https://doi.org/10.1117/12.2607676

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