Claude Thibeault and Yvon Savaria
Paper (1992)
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| Additional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
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| Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
| ISBN: | 0818628375 |
| PolyPublie URL: | https://publications.polymtl.ca/43087/ |
| Conference Title: | IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems (DFT 1992) |
| Conference Location: | Dallas, TX, United states |
| Conference Date(s): | 1992-11-04 - 1992-11-06 |
| Publisher: | IEEE |
| DOI: | 10.1109/dftvs.1992.224366 |
| Official URL: | https://doi.org/10.1109/dftvs.1992.224366 |
| Date Deposited: | 18 Apr 2023 15:26 |
| Last Modified: | 08 Apr 2025 07:07 |
| Cite in APA 7: | Thibeault, C., & Savaria, Y. (1992, November). Comparing results from defect-tolerant yield models [Paper]. IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems (DFT 1992), Dallas, TX, United states. https://doi.org/10.1109/dftvs.1992.224366 |
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