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T-BIST: A built-in self-test for analog circuits based on parameter translation

M. Slamani and Bozena Kaminska

Paper (1993)

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Additional Information: Nom historique du département: Département de génie électrique et de génie informatique
Department: Department of Electrical Engineering
Department of Computer Engineering and Software Engineering
PolyPublie URL: https://publications.polymtl.ca/42628/
Conference Title: 2nd IEEE Asian Test Symposium (ATS 1993)
Conference Location: Beijing, China
Conference Date(s): 1993-11-16 - 1993-11-18
Publisher: IEEE
DOI: 10.1109/ats.1993.398798
Official URL: https://doi.org/10.1109/ats.1993.398798
Date Deposited: 18 Apr 2023 15:26
Last Modified: 05 Apr 2024 11:40
Cite in APA 7: Slamani, M., & Kaminska, B. (1993, November). T-BIST: A built-in self-test for analog circuits based on parameter translation [Paper]. 2nd IEEE Asian Test Symposium (ATS 1993), Beijing, China. https://doi.org/10.1109/ats.1993.398798

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