Mohamed Slamani and Bozena Kaminska
Paper (1993)
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| Additional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
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| Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
| PolyPublie URL: | https://publications.polymtl.ca/42628/ |
| Conference Title: | 2nd IEEE Asian Test Symposium (ATS 1993) |
| Conference Location: | Beijing, China |
| Conference Date(s): | 1993-11-16 - 1993-11-18 |
| Publisher: | IEEE |
| DOI: | 10.1109/ats.1993.398798 |
| Official URL: | https://doi.org/10.1109/ats.1993.398798 |
| Date Deposited: | 18 Apr 2023 15:26 |
| Last Modified: | 08 Apr 2025 07:07 |
| Cite in APA 7: | Slamani, M., & Kaminska, B. (1993, November). T-BIST: A built-in self-test for analog circuits based on parameter translation [Paper]. 2nd IEEE Asian Test Symposium (ATS 1993), Beijing, China. https://doi.org/10.1109/ats.1993.398798 |
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