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Boyogueno Bendé, A., Slamani, M., Creighton, R. W., & Ilow, J. (2000, March). Power penalty improvement for burst-mode fibre optic receivers [Paper]. 2000 Canadian Conference on Electrical and Computer Engineering: Navigating to a New Era, Halifax, NS, Canada. External link
Boyogueno Bendé, A., Kaminska, B., & Slamani, M. (2000, May). A preamplifier IC design for photonic links [Paper]. IEEE International Symposium on Circuits and Systems. Emerging Technologies for the 21st Century (ISCAS 2000 Geneva), Geneva, Switzerland. External link
Djemouai, A., Sawan, M., & Slamani, M. (2000, December). New CMOS integrated pulse width modulator for voltage conversion applications [Paper]. 7th IEEE International Conference on Electronics, Circuits and Systems (ICECS 2000), Jounieh, Lebanon. External link
Djemouai, A., Sawan, M., & Slamani, M. Short Locking Time Fll and Pll Based on a Dll Technique [Paper]. 43rd IEEE Midwest Symposium on Circuits and Systems (MWSCAS 2000). External link
Djemouai, A., Sawan, M., & Slamani, M. 200 MHZ frequency-locked loop based on new frequency-to-voltage converters approach [Paper]. IEEE International Symposium on Circuits and Systems (ISCAS 1999). External link
Djemouai, A., Sawan, M., & Slamani, M. Efficient RF power transfer and bidirectional data transmission to implantable electronic devices [Paper]. IEEE International Symposium on Circuits and Systems (ISCAS 1999). External link
Djemouai, A., Sawan, M., & Slamani, M. (1999, September). New circuit techniques based on a high performance frequency-to-voltage converter [Paper]. 6th IEEE International Conference on Electronics, Circuits and Systems (ICECS 1999), Pafos, Cyprus. External link
Djemouai, A., Sawan, M., & Slamani, M. (1998, December). High performance integrated CMOS frequency-to-voltage converter [Paper]. 10th International Conference on Microelectronics, Monastir, Tunisia. External link
Mechta, A., Slamani, M., Zaoui, M., Mayer, J. R. R., & Châtelain, J.-F. (2022). Correlation assessment and modeling of intra-axis errors of prismatic axes for CNC machine tools. International Journal of Advanced Manufacturing Technology, 120(7-8), 5093-5115. External link
Slamani, M., Elhadi, A., Amroune, S., Arslane, M., Jomaa, W., Fouad, H., Châtelain, J.-F., & Jawaid, M. (2024). Investigating the impact of drill material on hole quality in jute/palm fiber reinforced hybrid composite drilling with uncertainty analysis. Heliyon, 10(17), e36925 (23 pages). Available
Slamani, M., Chatelain, J.-F., Il, A., & Balazinski, M. (2021). Statistical analysis and modeling of temperature distribution during various milling operations of thin walled aircraft parts. Physica A: Statistical Mechanics and its Applications, 570, 20 pages. External link
Slamani, M., Mayer, J. R. R., Balazinski, M., Carrier, B., & Engin, Ş. (2012). Improvement to High-Speed End Mill Boring Accuracy by a Simple Compensation Strategy. Machining Science and Technology, 16(1), 1-19. External link
Slamani, M., Mayer, J. R. R., Balazinski, M., Zargarbashi, S. H. H., Engin, Ş., & Lartigue, C. (2010). Dynamic and geometric error assessment of an XYC axis subset on five-axis high-speed machine tools using programmed end point constraint measurements. International Journal of Advanced Manufacturing Technology, 50(9-12), 1063-1073. External link
Slamani, M. (2009). Modélisation des erreurs géométriques et dynamiques pour prédire et compenser les erreurs volumétriques des machines-outils à cinq axes (applications fraisage orbital) [Ph.D. thesis, École Polytechnique de Montréal]. Unavailable
Slamani, M. (2004). Modélisation des écarts cinématiques articulaires par les polynômes [Master's thesis, École Polytechnique de Montréal]. Unavailable
Sylla, I. T., Slamani, M., Kaminska, B., Hossein, F. M., & Vincent, P. (1998, April). Impedance mismatch and lumped capacitance effects in high frequency testing [Paper]. 16th IEEE VLSI Test Symposium, Monterey, CA, USA. External link
Slamani, M., & Kaminska, B. (1993, November). T-BIST: A built-in self-test for analog circuits based on parameter translation [Paper]. 2nd IEEE Asian Test Symposium (ATS 1993), Beijing, China. External link
