D. Audet, S. Masson and Yvon Savaria
Paper (1998)
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| Department: | Department of Electrical Engineering |
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| PolyPublie URL: | https://publications.polymtl.ca/40287/ |
| Conference Title: | IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 1998) |
| Conference Location: | Austin, TX |
| Conference Date(s): | 1998-11-02 - 1998-11-04 |
| Publisher: | IEEE |
| DOI: | 10.1109/dftvs.1998.732172 |
| Official URL: | https://doi.org/10.1109/dftvs.1998.732172 |
| Date Deposited: | 18 Apr 2023 15:22 |
| Last Modified: | 25 Sep 2024 16:25 |
| Cite in APA 7: | Audet, D., Masson, S., & Savaria, Y. (1998, November). Reducing fault sensitivity of microprocessor-based systems by modifying workload structure [Paper]. IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 1998), Austin, TX. https://doi.org/10.1109/dftvs.1998.732172 |
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