Fatima Zahra Tazi, Claude Thibeault and Yvon Savaria
Paper (2016)
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| Department: | Department of Electrical Engineering |
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| Research Center: | GR2M - Microelectronics and Microsystems Research Group |
| ISBN: | 9781467387217 |
| PolyPublie URL: | https://publications.polymtl.ca/36187/ |
| Conference Title: | IEEE Canadian Conference on Electrical and Computer Engineering (CCECE 2016) |
| Conference Location: | Vancouver, British Columbia |
| Conference Date(s): | 2016-05-15 - 2016-05-18 |
| Publisher: | IEEE |
| DOI: | 10.1109/ccece.2016.7726600 |
| Official URL: | https://doi.org/10.1109/ccece.2016.7726600 |
| Date Deposited: | 18 Apr 2023 15:06 |
| Last Modified: | 08 Apr 2025 12:21 |
| Cite in APA 7: | Tazi, F. Z., Thibeault, C., & Savaria, Y. (2016, May). Detailed analysis of radiation-induced delays on I/O blocks of an SRAM-based FPGA [Paper]. IEEE Canadian Conference on Electrical and Computer Engineering (CCECE 2016), Vancouver, British Columbia (5 pages). https://doi.org/10.1109/ccece.2016.7726600 |
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