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Defect diagnosis algorithms for a field programmable interconnect network embedded in a very large area integrated circuit

G. Sion, Y. Blaquiere and Yvon Savaria

Paper (2015)

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Department: Department of Electrical Engineering
Research Center: GR2M - Microelectronics and Microsystems Research Group
PolyPublie URL: https://publications.polymtl.ca/36186/
Conference Title: 21st International On-Line Testing Symposium (IOLTS 2015)
Conference Location: Athena Pallas, Greece
Conference Date(s): 2015-07-06 - 2015-07-08
Publisher: IEEE
DOI: 10.1109/iolts.2015.7229837
Official URL: https://doi.org/10.1109/iolts.2015.7229837
Date Deposited: 18 Apr 2023 15:07
Last Modified: 05 Apr 2024 11:29
Cite in APA 7: Sion, G., Blaquiere, Y., & Savaria, Y. (2015, July). Defect diagnosis algorithms for a field programmable interconnect network embedded in a very large area integrated circuit [Paper]. 21st International On-Line Testing Symposium (IOLTS 2015), Athena Pallas, Greece. https://doi.org/10.1109/iolts.2015.7229837

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