J. Crépeau, Claude Thibeault and Yvon Savaria
Paper (1993)
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| Additional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
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| Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
| ISBN: | 0818635029 |
| PolyPublie URL: | https://publications.polymtl.ca/35265/ |
| Conference Title: | IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems (DFT 1993) |
| Conference Location: | Venice, Italy |
| Conference Date(s): | 1993-10-27 - 1993-10-29 |
| Publisher: | IEEE |
| DOI: | 10.1109/dftvs.1993.595745 |
| Official URL: | https://doi.org/10.1109/dftvs.1993.595745 |
| Date Deposited: | 18 Apr 2023 15:26 |
| Last Modified: | 08 Apr 2025 06:56 |
| Cite in APA 7: | Crépeau, J., Thibeault, C., & Savaria, Y. (1993, October). Some results on yield and local design rule relaxation [Paper]. IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems (DFT 1993), Venice, Italy. https://doi.org/10.1109/dftvs.1993.595745 |
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