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Pseudo-random vector compaction for sequential testability

Naim BenHamida, Bozena Kaminska and Yvon Savaria

Paper (1994)

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Additional Information: Nom historique du département: Département de génie électrique et de génie informatique
Department: Department of Electrical Engineering
Department of Computer Engineering and Software Engineering
PolyPublie URL: https://publications.polymtl.ca/33545/
Conference Title: IEEE International Symposium on Circuits and Systems (ISCAS 1994)
Conference Location: London, England
Conference Date(s): 1994-05-30 - 1994-06-02
Publisher: IEEE
DOI: 10.1109/iscas.1994.409197
Official URL: https://doi.org/10.1109/iscas.1994.409197
Date Deposited: 18 Apr 2023 15:25
Last Modified: 05 Apr 2024 11:24
Cite in APA 7: BenHamida, N., Kaminska, B., & Savaria, Y. (1994, May). Pseudo-random vector compaction for sequential testability [Paper]. IEEE International Symposium on Circuits and Systems (ISCAS 1994), London, England. https://doi.org/10.1109/iscas.1994.409197

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