Naim BenHamida, Bozena Kaminska and Yvon Savaria
Paper (1994)
An external link is available for this item
| Additional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
|---|---|
| Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
| PolyPublie URL: | https://publications.polymtl.ca/33545/ |
| Conference Title: | IEEE International Symposium on Circuits and Systems (ISCAS 1994) |
| Conference Location: | London, England |
| Conference Date(s): | 1994-05-30 - 1994-06-02 |
| Publisher: | IEEE |
| DOI: | 10.1109/iscas.1994.409197 |
| Official URL: | https://doi.org/10.1109/iscas.1994.409197 |
| Date Deposited: | 18 Apr 2023 15:25 |
| Last Modified: | 25 Sep 2024 16:16 |
| Cite in APA 7: | BenHamida, N., Kaminska, B., & Savaria, Y. (1994, May). Pseudo-random vector compaction for sequential testability [Paper]. IEEE International Symposium on Circuits and Systems (ISCAS 1994), London, England. https://doi.org/10.1109/iscas.1994.409197 |
|---|---|
Statistics
Dimensions
Repository Staff Only
|
View Item |
