<  Back to the Polytechnique Montréal portal

Mega bit CMOS SRAM chip failure analysis using external electrical testing and internal contactless laser beam testing

Venkatapathi N. Rayapati and Bozena Kaminska

Paper (1994)

An external link is available for this item
Additional Information: Nom historique du département: Département de génie électrique et de génie informatique
Department: Department of Electrical Engineering
Department of Computer Engineering and Software Engineering
PolyPublie URL: https://publications.polymtl.ca/32925/
Conference Title: IEEE International Workshop on Memory Technology, Design, and Testing
Conference Location: San Jose, Cal, USA
Conference Date(s): 1994-08-08 - 1994-08-09
Publisher: Institute of Electrical and Electronics Engineers
DOI: 10.1109/mtdt.1994.397200
Official URL: https://doi.org/10.1109/mtdt.1994.397200
Date Deposited: 18 Apr 2023 15:25
Last Modified: 05 Apr 2024 11:23
Cite in APA 7: Rayapati, V. N., & Kaminska, B. (1994, August). Mega bit CMOS SRAM chip failure analysis using external electrical testing and internal contactless laser beam testing [Paper]. IEEE International Workshop on Memory Technology, Design, and Testing, San Jose, Cal, USA. https://doi.org/10.1109/mtdt.1994.397200

Statistics

Dimensions

Repository Staff Only

View Item View Item