<  Back to the Polytechnique Montréal portal

New method for testing mixed analog and digital circuits

Janusz Rzeszut, Bozena Kaminska and Yvon Savaria

Paper (1995)

An external link is available for this item
Additional Information: Nom historique du département: Département de génie électrique et de génie informatique
Department: Department of Electrical Engineering
Department of Computer Engineering and Software Engineering
PolyPublie URL: https://publications.polymtl.ca/31759/
Conference Title: 4th Asian Test Symposium
Conference Location: Bangalore, India
Conference Date(s): 1995-11-23 - 1995-11-24
Publisher: IEEE
DOI: 10.1109/ats.1995.485327
Official URL: https://doi.org/10.1109/ats.1995.485327
Date Deposited: 18 Apr 2023 15:25
Last Modified: 05 Apr 2024 11:21
Cite in APA 7: Rzeszut, J., Kaminska, B., & Savaria, Y. (1995, November). New method for testing mixed analog and digital circuits [Paper]. 4th Asian Test Symposium, Bangalore, India. https://doi.org/10.1109/ats.1995.485327



Repository Staff Only

View Item View Item