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New method for testing mixed analog and digital circuits

Janusz Rzeszut, Bozena Kaminska and Yvon Savaria

Paper (1995)

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Additional Information: Nom historique du département: Département de génie électrique et de génie informatique
Department: Department of Electrical Engineering
Department of Computer Engineering and Software Engineering
PolyPublie URL: https://publications.polymtl.ca/31759/
Conference Title: 4th Asian Test Symposium
Conference Location: Bangalore, India
Conference Date(s): 1995-11-23 - 1995-11-24
Publisher: IEEE
DOI: 10.1109/ats.1995.485327
Official URL: https://doi.org/10.1109/ats.1995.485327
Date Deposited: 18 Apr 2023 15:25
Last Modified: 05 Apr 2024 11:21
Cite in APA 7: Rzeszut, J., Kaminska, B., & Savaria, Y. (1995, November). New method for testing mixed analog and digital circuits [Paper]. 4th Asian Test Symposium, Bangalore, India. https://doi.org/10.1109/ats.1995.485327

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