Janusz Rzeszut, Bozena Kaminska and Yvon Savaria
Paper (1995)
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| Additional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
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| Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
| PolyPublie URL: | https://publications.polymtl.ca/31759/ |
| Conference Title: | 4th Asian Test Symposium |
| Conference Location: | Bangalore, India |
| Conference Date(s): | 1995-11-23 - 1995-11-24 |
| Publisher: | IEEE |
| DOI: | 10.1109/ats.1995.485327 |
| Official URL: | https://doi.org/10.1109/ats.1995.485327 |
| Date Deposited: | 18 Apr 2023 15:25 |
| Last Modified: | 25 Sep 2024 16:13 |
| Cite in APA 7: | Rzeszut, J., Kaminska, B., & Savaria, Y. (1995, November). New method for testing mixed analog and digital circuits [Paper]. 4th Asian Test Symposium, Bangalore, India. https://doi.org/10.1109/ats.1995.485327 |
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