M. Soufi, Yvon Savaria
and Bozena Kaminska
Paper (1995)
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| Additional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
|---|---|
| Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
| PolyPublie URL: | https://publications.polymtl.ca/31713/ |
| Conference Title: | 13th IEEE VLSI Test Symposium |
| Conference Location: | Princeton, NJ, USA |
| Conference Date(s): | 1995-04-30 - 1995-05-03 |
| Publisher: | IEEE |
| DOI: | 10.1109/vtest.1995.512651 |
| Official URL: | https://doi.org/10.1109/vtest.1995.512651 |
| Date Deposited: | 18 Apr 2023 15:25 |
| Last Modified: | 08 Apr 2025 06:52 |
| Cite in APA 7: | Soufi, M., Savaria, Y., & Kaminska, B. (1995, April). On the design of at-speed testable VLSI circuits [Paper]. 13th IEEE VLSI Test Symposium, Princeton, NJ, USA. https://doi.org/10.1109/vtest.1995.512651 |
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