M. Soufi, Yvon Savaria
and Bożena Kamińska
Paper (1995)
An external link is available for this item
| Additional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
|---|---|
| Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
| PolyPublie URL: | https://publications.polymtl.ca/31712/ |
| Conference Title: | IEEE International Symposium on Circuits and Systems (ISCAS 1995) |
| Conference Location: | Seattle, WA, USA |
| Conference Date(s): | 1995-04-30 - 1995-05-03 |
| Publisher: | Institute of Electrical and Electronics Engineers |
| DOI: | 10.1109/iscas.1995.519922 |
| Official URL: | https://doi.org/10.1109/iscas.1995.519922 |
| Date Deposited: | 18 Apr 2023 15:25 |
| Last Modified: | 14 Apr 2026 10:42 |
| Cite in APA 7: | Soufi, M., Savaria, Y., & Kamińska, B. (1995, April). On Using partial reset for pseudo-random testing [Paper]. IEEE International Symposium on Circuits and Systems (ISCAS 1995), Seattle, WA, USA. https://doi.org/10.1109/iscas.1995.519922 |
|---|---|
Statistics
Dimensions
Repository Staff Only
|
View Item |
