Wang Tongqing, Ke Wu
and Cevdet Akyel
Paper (1995)
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| Additional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
|---|---|
| Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
| ISBN: | 0780326156 |
| PolyPublie URL: | https://publications.polymtl.ca/31685/ |
| Conference Title: | IEEE Instrumentation and Measurement Technology Conference (IMTC 1995) |
| Conference Location: | Waltham, MA, USA |
| Conference Date(s): | 1995-04-24 - 1995-04-26 |
| Publisher: | IEEE |
| DOI: | 10.1109/imtc.1995.515111 |
| Official URL: | https://doi.org/10.1109/imtc.1995.515111 |
| Date Deposited: | 18 Apr 2023 15:25 |
| Last Modified: | 08 Apr 2025 06:52 |
| Cite in APA 7: | Tongqing, W., Wu, K., & Akyel, C. (1995, April). A direct technique for determining complex permittivity of dielectric material in a measurement cavity [Paper]. IEEE Instrumentation and Measurement Technology Conference (IMTC 1995), Waltham, MA, USA. https://doi.org/10.1109/imtc.1995.515111 |
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