A direct technique for determining complex permittivity of dielectric material in a measurement cavity

Wang Tongqing, Ke Wu and Cevdet Akyel

Paper (1995)

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Additional Information:	Nom historique du département: Département de génie électrique et de génie informatique
Department:	Department of Electrical Engineering Department of Computer Engineering and Software Engineering
PolyPublie URL:	https://publications.polymtl.ca/31685/
Conference Title:	IEEE Instrumentation and Measurement Technology Conference (IMTC 1995)
Conference Location:	Waltham, MA, USA
Conference Date(s):	1995-04-24 - 1995-04-26
Publisher:	IEEE
DOI:	10.1109/imtc.1995.515111
Official URL:	https://doi.org/10.1109/imtc.1995.515111
Date Deposited:	18 Apr 2023 15:25
Last Modified:	05 May 2023 15:37

Cite in APA 7:	Tongqing, W., Wu, K., & Akyel, C. (1995, April). A direct technique for determining complex permittivity of dielectric material in a measurement cavity [Paper]. IEEE Instrumentation and Measurement Technology Conference (IMTC 1995), Waltham, MA, USA. https://doi.org/10.1109/imtc.1995.515111
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