Nicolas Bertrand, B. Drévillon, Jolanta-Ewa Sapieha
and Ludvik Martinu
Paper (1996)
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| Department: | Department of Engineering Physics |
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| PolyPublie URL: | https://publications.polymtl.ca/31501/ |
| Conference Title: | 23rd International Conference on Metallurgical Coatings and Thin Films (ICMCTF"96) |
| Conference Location: | San Diego, CA, USA |
| Conference Date(s): | 1996-04-22 - 1996-04-26 |
| Journal Title: | Thin solid films (vol. 290-291) |
| Publisher: | Elsevier |
| DOI: | 10.1016/s0040-6090(96)09179-1 |
| Official URL: | https://doi.org/10.1016/s0040-6090%2896%2909179-1 |
| Date Deposited: | 18 Apr 2023 15:24 |
| Last Modified: | 08 Apr 2025 06:52 |
| Cite in APA 7: | Bertrand, N., Drévillon, B., Sapieha, J.-E., & Martinu, L. (1996, April). In situ IR ellipsometry study of the adhesion and growth of plasma deposited silica thin films on stainless steel substrates [Paper]. 23rd International Conference on Metallurgical Coatings and Thin Films (ICMCTF"96), San Diego, CA, USA. Published in Thin solid films, 290-291. https://doi.org/10.1016/s0040-6090%2896%2909179-1 |
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