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In situ IR ellipsometry study of the adhesion and growth of plasma deposited silica thin films on stainless steel substrates

N. Bertrand, B. Drevillon, Jolanta-Ewa Sapieha and Ludvik Martinu

Paper (1996)

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Department: Department of Engineering Physics
PolyPublie URL: https://publications.polymtl.ca/31501/
Conference Title: ICMCTF"96
Conference Date(s): 1996-01-01 - 1996-12-31
Journal Title: Thin solid films (vol. 290-291)
Publisher: Elsevier
DOI: 10.1016/s0040-6090(96)09179-1
Official URL: https://doi.org/10.1016/s0040-6090%2896%2909179-1
Date Deposited: 18 Apr 2023 15:24
Last Modified: 05 Apr 2024 11:21
Cite in APA 7: Bertrand, N., Drevillon, B., Sapieha, J.-E., & Martinu, L. (1996, January). In situ IR ellipsometry study of the adhesion and growth of plasma deposited silica thin films on stainless steel substrates [Paper]. ICMCTF"96. Published in Thin solid films, 290-291. https://doi.org/10.1016/s0040-6090%2896%2909179-1

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