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Documents dont l'auteur est "Drevillon, B."

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Nombre de documents: 6

B

Bertrand, N., Drevillon, B., Gheorghiu, A., Senemaud, C., Martinu, L., & Sapieha, J.-E. (1998). Adhesion improvement of plasma-deposited silica thin films on stainless steel substrate studied by x-ray photoemission spectroscopy and in situ infrared ellipsometry. Journal of vacuum science and technology. A, Vacuum, surfaces, and films, 16(1), 6-12. Lien externe

V

Vallon, S., Hofrichter, A., Drevillon, B., Sapieha, J.-E., Martinu, L., Poncin-Epaillard, F., Schalchli, A., & Benattar, J. J. (septembre 1996). Adhesion improvement of silica layers on polypropylene and polycarbonate induced by plasma treatments [Communication écrite]. EURADH 1996 and Adhesion 1996, Cambridge. Non disponible

Vallon, S., Brenot, R., Hofrichter, A., Drevillon, B., Gheorghiu, A., Senemaud, C., Sapieha, J.-E., Martinu, L., & Poncin-Epaillard, F. (1996). Adhesion mechanisms in silica layers on plasma-treated polymers. Part II. Polypropylene. Journal of Adhesion Science and Technology, 10(12), 1313-1332. Lien externe

Vallon, S., Hofrichter, A., Guyot, L., Drevillon, B., Sapieha, J.-E., Martinu, L., & Poncin-Epaillard, F. (1996). Adhesion mechanisms of silica layers on plasma-treated polymers. Part I. Polycarbonate. Journal of Adhesion Science and Technology, 10(12), 1287-1311. Lien externe

Vallon, S., Drevillon, B., Poncin-Epaillard, F., Sapieha, J.-E., & Martinu, L. (1996). Argon plasma treatment of polycarbonate: In situ spectroellipsometry study and polymer characterizations. Journal of vacuum science and technology. A, Vacuum, surfaces, and films, 14(6), 3194-3201. Lien externe

Vallon, S., Hofrichter, A., Drevillon, B., Sapieha, J.-E., Martinu, L., & Poncin-Epaillard, F. (avril 1996). Improvement of the adhesion of silica layers to polypropylene induced by nitrogen plasma treatment [Communication écrite]. 23rd International Conference on Metallurgical Coatings and Thin Films (ICMCTF 1996), San Diego, CA. Publié dans Thin solid films, 290-291. Lien externe

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