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Bertrand, N., Drevillon, B., Gheorghiu, A., Senemaud, C., Martinu, L., & Sapieha, J.-E. (1998). Adhesion improvement of plasma-deposited silica thin films on stainless steel substrate studied by x-ray photoemission spectroscopy and in situ infrared ellipsometry. Journal of vacuum science and technology. A, Vacuum, surfaces, and films, 16(1), 6-12. Lien externe
Bertrand, N., Drevillon, B., Sapieha, J.-E., & Martinu, L. (janvier 1996). In situ IR ellipsometry study of the adhesion and growth of plasma deposited silica thin films on stainless steel substrates [Communication écrite]. ICMCTF"96. Publié dans Thin solid films, 290-291. Lien externe
